J. A. Woollam M-88 Ellipsometer

J. A. Woollam M-88 Ellipsometer

Determines multilayer thicknesses, optical constants, crystallinity, surface and interfacial roughness. Has a 300 mm programmable sample stage with motorized rotation and 88 wavelengths from 280 to 760 nm. Completes full spectrum measurment in 1/20 s.

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