Nanometrics Nanospec 2100
Thin film measurement system that measures the thickness of thin films. Uses spectroscopic reflectometry to determine film thickness and other film details.
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- Facilities & Equipment
- Bioactive Materials Characterization
- Combinatorial Science
- Design
- Polymer Synthesis
- Polymer Screening
- Coating Preparation
- Coating Deposition
- Coating Screening
- Analysis
- Electronics Design
- Electronics Prototype Fabrication
- Advanced Chip Packaging & Assembly
- Process Support Equipment
- Test & Inspection
- Fluidic Self Assembly
- Wafer Processing
- Materials Characterization
- RFID Lab - RWSL