COMING SOON--JULY 2013!
NDSU has been awarded a $482,807 grant (Award #1229417) from the National Science Foundation (NSF) Division of Biological Infrastructure for a versatile state-of-the-art X-ray inspection and computed tomography (microCT) system. Principal Investigator for the Major Research Instrumentation grant (MRI) is Kendra Greenlee, assistant professor of Biological Sciences. Co-principal investigators are Scott Payne, assistant director, and Jayma Moore, laboratory manager, of the Electron Microscopy Center. The 2012 MRI award is the fourth in six years for the Electron Microscopy Center.
The new microCT system will allow external and internal evaluation of intact objects, not otherwise possible without permanent damage. Like computed tomography (“CAT scanning”), microCT equipment acquires successive X-ray image slices of an object. Once the images are obtained, the microCT software can manipulate them to provide highly detailed information: digital 3D reconstruction, exterior and interior measurements, density analysis, defect inspection, and surface rendering for finite element analysis. This type of nondestructive testing has wide-ranging research and commercial applications.
Transmission electron microscopy and Microanalysis
- JEOL JEM-100 CX II transmission electron microscope
- JEOL JEM-2100 analytical transmission electron microscope
Scanning electron microscopy and Microanalysis
- JEOL JSM-6490LV variable-pressure scanning electron microscope system with remote operability
- Noran System SIX X-ray microanalysis system with Nanotrace Si(Li) detector for the JSM-6490LV SEM
- JEOL JSM-7600F analytical high-resolution field-emission scanning electron microscope
- Noran System 7 X-ray microanalysis system with UltraDry series detector, NORVAR 30 mm2 light-element window
Sample Preparation Equipment
- Dimple Grinder GATAN model 656
- GATAN Precision Ion Polishing System
- Ultrasonic Cutter GATAN Model 601
- Disc Grinder GATAN Model 623
- RMC MTXL Ultramicrotome
- Cryoultramicrotome: RMC Powertome XL with CR-X crysectioning system
- 2 sputter coaters for metallic conductive coating of SEM samples
- Carbon coater, high-vacuum, Cressington 208C Turbo
- 2 critical-point driers
- Precision saw, Buehler IsoMet 1000
- Cross Section Polisher, JEOL IB09010CP
- CARV confocal scanning unit attached to Nikon Eclipse E600W fluorescence light microscope
- Olympus and Leitz research-grade compound and stereo light microscopes
- 3 rotary microtomes
-Digital imaging, storage, and retrieval capabilities
-Codonics NP-2660 photographic network printer
-Epson Stylus Photo 2200 color inkjet photographic printer
All of our electron microscopes are in climate-controlled rooms for your comfort and best microscope performance.