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GE v|tome|x s microCT

Installed in 2013, the GE v|tome|x s microCT makes it possible to evaluate internal structure nondestructively.  This state-of-the-art 240kV microfocus X-ray computed tomography system has an additional 180kV submicron X-ray tube and high-contrast digital flat panel detector for the greatest possible versatility.  Samples up to 420 mm X 260 mm and 50 kg can be scanned in the large open chamber.  The small focal spot size (variable down to 0.8 ┬Ám) provides excellent resolution and detail detectability.


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NDSU Electron Microscopy Center

1307 N. 18th Street, Fargo, North Dakota

701.231.8435    ndsu.em.center@ndsu.edu

Last Updated: Friday, September 27, 2013 12:46:18 PM