JEOL JSM-6490LV High-performance variable pressure SEM
- Flexible: built-in high- and low-vacuum modes
- Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
- Minimal processing artifacts and sample alteration--reduced need for conductive coating
- Web-based capability over a standard internet connection, without special software. This makes it possible to view and/or operate the electron microscope at your location--perfect for classroom teachers and others. Click here for remote-use information.
The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.