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JEOL JSM-6490LV High-performance variable pressure SEM

 

 

  • Flexible:  built-in high- and low-vacuum modes
  • Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
  • Minimal processing artifacts and sample alteration--reduced need for conductive coating
  • Web-based capability over a standard internet connection, without special software.  This makes it possible to view and/or operate the electron microscope at your location--perfect for classroom teachers and others.  Click here for remote-use information.

The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.


Student Focused. Land Grant. Research University.

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NDSU Electron Microscopy Center

1307 N. 18th Street, Fargo, North Dakota

701.231.8435    ndsu.em.center@ndsu.edu

Last Updated: Wednesday, October 13, 2010 1:33:50 PM