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Book Chapter

  1. Shah, L., Shahraki, A.F., and Yadav, O.P. (2019). Application of Stochastic Processes in Degradation Modeling: an Overview. Reliability Engineering: Methods and Applications, CRC Press: A Taylor and Francis Group, (In Press).
  2. Shah, L. and Yadav, O. P. (2016). “Reliability estimation considering warranty data, usage rate profile, and qualitative information on design changes,” Mathematics Applied in Engineering Edited by Mangey Ram and J.P. Davim, Elsevier Limited, 2017, Chapter 9, pp. 171-190.

Technical Report

  1. Design and Development of Accelerated Degradation Test Methodology for Hydrostatic System, submitted to  ND Department of Commerce and Bobcat
  2. IC Integration Technologies for Flexible Hybrid Electronics (FHE)--Uniqarta

Journal Articles

  1. Davila-Frias, A., Limon, S., Marinov, V., & Yadav, O. P. (2021). Reliability Evaluation of Flexible Hybrid Electronics Systems Considering Degradation Behavior Under Multistress Operating Conditions. Journal of Electronic Packaging, 143(2), 021003.

  2. Davila-Frias, A., Yadav, O. P., & Marinov, V. (2020). A Review of Methods for the Reliability Testing of Flexible Hybrid Electronics. IEEE Transactions on Components, Packaging and Manufacturing Technology.

  3. Limon, S., Rezaei, E., & Yadav, O. P. (2020). Designing an accelerated degradation test plan considering the gamma degradation process with multi-stress factors and interaction effects. Quality Technology & Quantitative Management, 17(5), 544-560.

  4. Shahraki, A. F., Yadav, O. P., & Vogiatzis, C. (2020). Selective maintenance optimization for multi-state systems considering stochastically dependent components and stochastic imperfect maintenance actions. Reliability Engineering & System Safety, 196, 106738.

  5. Ni, Z., Lyu, X., Yadav, O. P., Singh, B. N., Zheng, S., & Cao, D. (2019). Overview of real-time lifetime prediction and extension for SiC power converters. IEEE Transactions on Power Electronics, 35(8), 7765-7794

  6. Limon, S. and Yadav, O. P. (2017).  Reliability estimation considering warranty data, usage rate profile, and qualitative information on design changes.  Mathematics Applied in Engineering, Elsevier, 2017. Chapter 9, pp. 171-190.

  7. Limon, S., Yadav, O.P. and Liao, H. (2017). “A review of important methods and optimal planning of accelerated tests for reliability assessment,” Quality and Reliability Engineering International, Vol. 33, pp. 2361-2383

  8. Shahraki, A. F., Yadav, O. P., & Liao, H. (2017). A review on degradation modelling and its engineering applications. International Journal of Performability Engineering, 13(3), 299.

  9. Limon, S., Yadav, O.P., Zuo, M.J., Muscha, J, and Honeyman, R. (2016). “Reliability Estimation Considering Usage Rate Profile & Warranty Claims,” Journal of Risk and Reliability, Vol. 230, No. 3, pp. 297-308.

  10. Limon, S., Yadav, O.P., Nepal, B. and Monplaisir L. (2015). “Enabling Comprehensive Failure Analysis of Complex Physical System Using Cognitive Map-based Approach,” International Journal of Quality Engineering and Technology, Vol. 5, No. 2, pp. 114 - 144.

Conference Proceedings

  1. Davila-Frias, A., Yadav, O. P., Salem, S., & Nepal, B. (2021). All-Terminal Network Reliability Estimation with Monte Carlo and Deep Neural Networks. In IIE Annual Conference. Proceedings (pp. 169-174). Institute of Industrial and Systems Engineers (IISE).

  2. Davila-Frias, A., & Yadav, O. P. (2020). All-terminal network reliability estimation using convolutional neural networks. Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, 1748006X20969465.

  3. Davila-Frias, A., Marinov, V., Yadav, O. P., & Atanasov, Y. (2020, October). Design of Accelerated Degradation Test Method and Failure Analysis of Flexible Hybrid Electronic Devices. In International Electronic Packaging Technical Conference and Exhibition (Vol. 84041, p. V001T02A001). American Society of Mechanical Engineers.

  4. Davila-Frias, A., Yadav, O. P., & Marinov, V. (2020). A Review of Methods for the Reliability Testing of Flexible Hybrid Electronics. IEEE Transactions on Components, Packaging and Manufacturing Technology.

  5. Ni, Z., Lyu, X., Yadav, O. P., Singh, B. N., Zheng, S., & Cao, D. (2019). Overview of real-time lifetime prediction and extension for SiC power converters. IEEE Transactions on Power Electronics, 35(8), 7765-7794.

  6. Limon, S. and Yadav, O.P. (2019). Predicting Remaining Lifetime Using the Monotonic Gamma Process and Bayesian Inference for Multi-Stress Conditions, FAIM 2019 - 29th International Conference on Flexible Automation and Intelligent Manufacturing, Limerick, Ireland, June 24-28, 2019. 

  7. Frias, A. D. , Yodo, N. , and Yadav, O. P. , "Mixed-Degradation Profiles Assessment of Critical Components in Cyber-Physical Systems". RAMS Conference., Florida, USA, January 28-31, 2019. 

  8. Shahraki, A. F. and O.P. Yadav," Predicting remaining useful life of a multi-Component system based on instance based learning approach", RAMS Conference., Florida, USA, January 28-31, 2019.

  9. Gupta, A., Yadav, O.P., Roy, A., DeVoto, D, and Major, J. (2019). Degradation Modeling and Reliability Assessment of Capacitors, Proceedings of the ASME 2019 International Technical Conference and Exhibition  on Packaging and Integration of Electronic and Photonic Microsystems IPACK2019 October 7-9, 2019, Anaheim, CA, USA.

  10. Shahraki, A. F  and Yadav, O.P.," Selective Maintenance Optimization for Multi-state Systems Operating in Dynamic Environments", RAMS conference, Nevada, USA, 2018. Best Paper Glomoski Award by IISE Member Author in RAMS 2018)

  11. Limon, S. Yadav, O.P., and Nepal, B. (2018). Remaining Useful Life Prediction Using ADT data with Inverse Gaussian Process Model, Proceedings of Industrial and Systems Engineering Research Conference (IISE Annual Conference), Orlando, FL, May 19-22, 2018.

  12. Z. Ni, Li, Y. , Lyu, X. , Yadav, O. P., and Cao, D. , "Miller plateau as an indicator of SiC MOSFET gate oxide degradation", 2018 IEEE Applied Power Electronics Conference and Exposition (APEC), San Antonio, TX, 2018, pp. 1280-1287.

  13. Gupta, A., Yadav, O.P., DeVoto, D., and Major, J. (2018). A Review of Degradation Behavior and Modeling of Capacitors, Proceedings of the 2018 International Technical Conference and Exhibition on Packaging and Intergration of Electronic and Photonic Microsystems InterPACK 2018, August 27-30, 2018, San Francisco, CA.

  14. Shah, L., Yadav, O.P., and Nepal, B. (2017). “Estimation of Product Lifetime Considering Gamma Degradation Process with Multi-Stress Accelerated Test Data,” Proceedings of Industrial and Systems Engineering Research Conference (IISE Annual Conference), Pittsburgh, PA, May 21-24, 2017.

  15. Z. Ni, Lyu, X. , Yadav, O. P. , and Cao, D. , "Review of SiC MOSFET based three-phase inverter lifetime prediction", 2017 IEEE Applied Power Electronics Conference and Exposition (APEC), Tampa, FL, 2017, pp. 1007-1014.

  16. Shahraki, A. F., and Yadav, O.P. (2016). Condition-Based Maintenance of Two-Component Deteriorating Systems Considering the Dependency Between Components, Proceedings of Industrial and Systems Engineering Research Conference (IISE Annual Conference), Anaheim, CA, May 21-24, 2016.

  17. Shah,L. , Yadav, O.P., Muscha, J., and Nepal, B. (2015). Hydrostatic Transmission System Failure Analysis and Utilization of    Failure Knowledge: A Case Study, Proceedings of IEEE International Conference on Industrial Engineering and Engineering Management, Singapore, December 6-9, 2015.


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