Facilities and Research Centers
X-Ray Crystallography Facility
Welcome to the X-Ray Crystallography Facility in the Department of Chemistry and Biochemistry. The XCF is located in Dunbar Hall and is equipped with a Kappa Apex II Duo X-Ray Diffractometer and Philips X’pert MPD X-ray Powder Diffractometer with Thin Film Diffraction capabilities.
The XCF provides services for the needs of research groups within the university. The facility also provides services for those outside NDSU.
Kappa Apex II Duo
Kappa Apex II Duo is top-of-the-line solution for a sealed tube chemical crystallography system. It is equipped with Bruker’s latest 4-circle goniometer which combines the gold-standard high precision D8 base with the most versatile Kappa stage available, the most sensitive Apex II CCD detector for crystallography, and the unique combination of a low powered Cu IµS microfocus source plus standard sealed tube Mo X-ray source. The high brilliance Cu IµS microfocus source is suitable for absolute configuration and protein screening. For more information, contact MCL manager Angel Ugrinov.
Phillips X'Pert MPD Powder X-Ray Diffractometer
X-Ray Powder Diffractometer Phillips X’Pert MPD system is equipped with vertically mounted goniometer and Cu X-ray source. The instrument has Bragg-Brentano para-focusing optics for Phase and ω Stress analysis and Parallel beam optics for thin film experiments. The data collection is controlled by X’Pert data collector v. 1.2 and can perform different scans for powder samples. PDF-2 database and Jade + software are available (unfortunately the last update is since 1993) for search-math job.
Kappa Apex II Duo X-Ray Diffractometer
The Bruker Kappa Apex II Duo is the top-of-the-line solution for sealed tube chemical crystallography systems. It is equipped with Bruker’s latest four-circle goniometer which combines the gold-standard high precision D8 base with the most versatile Kappa stage available, the most sensitive Apex II CCD detector for crystallography, and the unique combination of a low powered Cu IµS microfocus source plus astandard sealed tube Mo X-ray source. The high brilliance Cu IµS microfocus source is suitable for absolute configuration and protein screening.
Samples may be submitted to the facility for analysis using the sample submittion form below:
All samples must be accompanied by a completed submission form. For further information, such as servic charges and professional advic,e please contact Angel Ugrinov, Ph.D.
Instrument Usage and Training
Students are encouraged to learn to operate the instrument and to critically analyze and interpret the data so that they may perform their own experiments under the supervision of the facility manager, Dr. Angel Ugrinov. Training is a personal custom hands-on process. Which means that every single student who has a sample for analysis can ask the manager for help and the student will be personally trained on his/her own sample. Before using the facility every student needs to complete a safety training class for working with radioactive materials and should wear his/her own dosimeter badge (ring).
Please contact Mike Borr at the NDSU Safety Office to schedule a radiation training session.
On-Line Training Modules and Information
NDSU Safety On-Line Training Resources
Radiation Safety Information
Radiation Hazards Presentation (pdf)
Radiation Hazards Review Form (pdf)
Radiation Safety Handbook - 2004 (pdf)
Radiation Statement of Training and Experience (pdf)
Radiation Statement of Agreement (pdf)
Radiation Film/Badge Request Form (pdf)
Resources: Manuals, Link and Books
Programs for structure determination and visualization
Reflex: a program that simulates X-ray, neutron, and electron powder diffraction patterns based on models of crystalline materials.
It aids the determination of crystal structure, assists the interpretation of diffraction data, and is applied to validate the results of experiment and computation.
IUC Teaching Pamphlets by The International Union of Crystallographers.
Very nice tutorials for diffractions and crystallography.
Werner Massa, Crystal Structure Determination, 2nd edition, Springer 2004
P. Müller, R. Herbst-Irmer, A. L. Spek, T. R. Schneider, M. R. Sawaya Crystal Structure Refinement (A Crystallographer’s Guide to SHELXL), Oxford University Press 2007