Veeco Dimension 3100 Atomic Force Microscopy (AFM)

AFM images sample surfaces with the resolution of the orders of a nanometer. It can also measure surface roughness; probe force spectroscopy, magnetic structures, and conductive conditions with the image size of up to 100 µm X 100 µm

Capability: 1) Contact mode; 2) Tapping mode; 3) Nanoindentation; 4) Force Modulation; 5) Magnetic Force; 6) Liquid Contact and Tapping; 7) Conductive.

Sample: solid sample with smooth surface either in air or liquid. 

Top of page