Content | Navigation |

GE v|tome|x s microCT

Installed in 2013, the GE v|tome|x s microCT enables nondestructive evaluation of internal structure.  This 240kV microfocus X-ray computed tomography system has an additional 180kV submicron X-ray tube and high-contrast digital flat panel detector for the greatest possible versatility.  Samples up to 420 mm X 260 mm and 50 kg can be scanned in the large open chamber.  The small focal spot size (variable down to 0.8 ┬Ám) provides excellent resolution and detail detectability.


Student Focused. Land Grant. Research University.

Follow NDSU
  • Facebook
  • Twitter
  • RSS
  • Google Maps

NDSU Electron Microscopy Center

1307 N. 18th Street, Fargo, North Dakota

701.231.8435    ndsu.em.center@ndsu.edu

Last Updated: Tuesday, February 21, 2017 8:12:08 AM
Privacy Statement