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GE v|tome|x s microCT

Installed in 2013, the GE v|tome|x s microCT enables nondestructive evaluation of internal structure.  This 240kV microfocus X-ray computed tomography system has an additional 180kV submicron X-ray tube and high-contrast digital flat panel detector for the greatest possible versatility.  Samples up to 420 mm X 260 mm and 50 kg can be scanned in the large open chamber.  The small focal spot size (variable down to 0.8 µm) provides excellent resolution and detail detectability.


Student Focused. Land Grant. Research University.

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NDSU Electron Microscopy Core

1307 N. 18th Street, Fargo, North Dakota

701.231.8435    ndsu.em.core@ndsu.edu

Last Updated: Monday, May 02, 2022 2:14:58 PM
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