GE v|tome|x s microCT
Installed in 2013, the GE v|tome|x s microCT enables nondestructive evaluation of internal structure. This 240kV microfocus X-ray computed tomography system has an additional 180kV submicron X-ray tube and high-contrast digital flat panel detector for the greatest possible versatility. Samples up to 420 mm X 260 mm and 50 kg can be scanned in the large open chamber. The small focal spot size (variable down to 0.8 µm) provides excellent resolution and detail detectability.