August 7, 2017: MULTIPURPOSE X-RAY DIFFRACTOMETER NOW AVAILABLE AT RCA RECHARGE CENTER
The RCA Recharge Center has recently repaired and upgraded the Bruker D8 Discover X-ray diffractometer. Work by Bruker technicians included installation of a Vantec-500 detector. This new 2-D detector provides enhanced capabilities for phase ID, phase quantification, texture, stress, small angle x-ray scattering, high-throughput screening, µXRD, and mapping. The instrument can play a significant role in analysis and characterization of many types of materials for research and educational objectives. RCA is very interested to discuss applications with potential users of this instrument. For more information, contact Greg Strommen (1-5339 firstname.lastname@example.org).
May 19, 2016: MNC PARTNERS WITH NDSU TO ADD ADVANCED PACKAGING CAPABILITY
The Device Packaging Laboratory (DPL), part of RCA’s Research Operations, is a partner with the Minnesota Nano Center (MNC) as part of the NSF National Nanotechnology Critical Infrastructure Network (NNCI). NDSU’s role in the network node is to provide capabilities in a new focus area in advanced packaging. The goal is to enable researchers in academia and industry to economically package their devices including difficult applications such as RF devices, MEMS, biomedical components, power devices, and 3D multichip systems. This will allow them to move their projects beyond a simple proof of concept to instead build the devices into functional systems for further assessment of performance and reliability. The NNCI grant is for a period of five years.
May 9, 2016: NMR REPAIRED
The 400 MHz NMR Spectrometer located in the Research 2 building has been repaired and is available again for use. JEOL’s ECA Series Nuclear Magnetic Resonance (NMR) Spectrometer is a high performance, research grade, 5mm standard probe system capable of probing nuclei (N15-P31) with resonance frequencies between 40MHz and 162MHz at field strength of 9.4 Tesla. Commonly probed nuclei include hydrogen, carbon, fluorine, and silicon. The ECA NMR also has solid state capabilities.
February 22, 2016: XPS SYSTEM ADDED TO RECHARGE CENTER
A Thermo Scientific K-Alpha™ X-ray Photoelectron Spectrometer (XPS) system has been added to the RCA recharge center. This XPS is a surface characterization technique with an analysis penetration depth of <10nm, it also features sputtering capabilities that allow for 3-dimensional chemical state and composition analysis. Surface etching of polymeric and other “soft” materials is possible with minimal alteration to the composition or chemical state of the material using a MAGCIS cluster ion gun. The system is a fully integrated, monochromated small-spot XPS with depth profiling capabilities.
Additional features and capabilities of the system include: selectable area spectroscopy, sputter depth profiling, micro-focused monochromator, snapshot acquisition, high-resolution chemical state spectroscopy, insulator analysis, and quantitative chemical imaging.