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JEOL JSM-7600F field-emission SEM

The 7600F is a field-emission scanning electron microscope that magnifies up to one million times for visualization and imaging of nanoscale-sized objects.  It provides optimal tools for studying the widest possible variety of sample materials:

  • high stable probe current
  • upper and lower secondary-electron detectors
  • retractable in-lens backscatter detector
  • low-angle backscatter detector
  • scanning transmission electron (STEM) detector
  • energy-dispersive X-ray spectrometry

Funded by a National Science Foundation grant (DMR-0923354) for over half a million dollars, this versatile and powerful instrument advances investigational capabilities at NDSU to match those at some of the country’s most prestigious research universities.  According to university Distinguished Professor Kalpana Katti, “This suite of SEMS and TEMs at NDSU Electron Microscopy will significantly expand the research enterprise on NDSU in the field of materials and bring it to national and international prominence as well as go a long way towards outreach efforts to K-12 students in ND in guiding and inspiring students towards high technology.”

Student Focused. Land Grant. Research University.

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NDSU Electron Microscopy Core

1307 N. 18th Street, Fargo, North Dakota


Last Updated: Monday, May 02, 2022 2:14:58 PM
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