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JEOL JSM-6490LV variable-pressure SEM


  • Flexible:  built-in high- and low-vacuum modes
  • Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
  • Minimal processing artifacts and sample alteration--reduced need for conductive coating

The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.

Student Focused. Land Grant. Research University.

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NDSU Electron Microscopy Core

1307 N. 18th Street, Fargo, North Dakota


Last Updated: Tuesday, November 22, 2022 11:36:50 AM
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